 | Power Semiconductor Testing SystemPower Semiconductor Testing System LEMSYS is a leading supplier of Test Equipment and associated Services for Power Semiconductors discrete devices and modules.
LEMSYS activity is focused on Power Semiconductor Test Equipment for Component Manufacturers, Power Electronics OEM Manufacturers and End users. Applications: Designed for testing of Static and Dynamic parameters of Diodes, SCRs, IGBT, GTO and Power BJTs and MOSFETs. Also available service testers for above devices for application in • Public Transportation: Maintenance and repair shops, Trains, Underground, Trolley-busses, Tramways, Ship, and others. • Heavy industry using rectifiers and converters : Steel mills, mines, aluminium plants, galvanic-plastic and chlorine industry. • Power electronics manufacturers: Drive, converter-inverter manufacturers, Repair shops (after sales), R & D.
Various Products of LEMSYS SA are :
• IGBT- MOSFET Power Modules ipm For testing switching characteristics of IGBT up to 2000A and 3000V
• Lemsys PRO LEMSYS pro modules for limited testing applications to be integrated into specific test environment for Modules or discrete devices. Tests: Forward Vge Drop, Blocking Vge, Leakage Current and gate characteristics Current: 2 – 1000A Voltage: 20 – 2200V (0.1 – 100mA)
• Rectifiers – Thyristors – GTO – Triacs It is designed a full range of power test equipment to satisfy the different customer's needs, for laboratory, production and maintenance. Tests for Rectifiers: Vf, Vr, Ir, Qrr, Qra, Irr, trr, Sfactor, dI/dt Current: up to 10000A Voltage: up to 10000V Tests for Thyristors: Vt, Vd, Vr, Id, Ir, Igt, Vgt, IH, IL, Tq, dV/dt, Qrr, Qra, Irr, trr Tests for GTO: Vt, Vd, Vr, Id, Ir, tgd, tgr, tdq, tfq, tz, Izm, Vdp, Vdm, Eon, Eoff Tests for Triacs: Commutating dV/dt, Commutating di/dt, Current drive capability,
• For Fast diodes Diode Measuring System (DMS) Soft recovery, Snap off, voltage overshoot, and the fast diode is the key to the performance of the final equipment. The Lemsys DMS has been designed for finding the most suitable diode, meeting customer needs and satisfying a particular application. Made for testing dynamic parameters of fast recovery diodes either in compliance to the standards or close to their working conditions. Fast diodes tests: trr, trra, Qrr, Qra, Turn-on, tfr Current: 0.1 up to 300A di/dt: 5 up to 500A/µs Vr voltage: 5 up to 400V Portable Test Equipment Portable Test Equipment The portable tester TP0620 is designed for easy and fast functional control of the major power semiconductors in the lab or on site (IGBT, MOSFET, diodes, Thyristors and other components). Tests: Breakdown voltage, leakage current, forward voltage drop Current: 3 to 600A Voltage: 50 to 2000V Gate: 15V – 200mA
• Test Generator Strap Power supply source for EMC testing, AC mains LF disturbance simulator, Impulse current and voltage power generators. Test equipment for current sensors.
• Connecting Devices / Press System Test Block for Power Modules and specific adapters for easy contacting and testing. Press, adaptors, heating systems and other devices to facilitate the physical handling of semiconductors to be measured. Temperature: from ambient temperature to 200°C Package: Presspack, power modules, stud or discrete devices
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