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Advance Scientific Equipment Pvt. Ltd.

Nagpur, Maharashtra

| GST  27AABCA3867B1ZY

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Advance Scientific Equipment Pvt. Ltd. - Distributor / Channel Partner of inductively coupled plasma atomic icp oes, glow discharge optical emission spectrometer gd profiler 2 & glow discharge optical emission spectrometer gd profiler in Nagpur, Maharashtra.

Inductively Coupled Plasma Atomic  ICP OES

The ICP OES has high quality optical design which integrates a high density holographic grating and one meter focal length associated with the unique Total Plasma View feature offers the highest resolution of the market along with high sensitivity and stability for the most demanding applications.

  • Unique Plasma Torch Design for Most Versatile and Accurate Analyses
  • Its high quality optical design which integrates a High Density Holographic Grating and One Meter Focal Length associated with the unique Total Plasma View feature offers the highest resolution of the market along with high sensitivity and stability for the most demanding applications.
  • Radial Viewing and Total Plasma View providing Lowest Detection Limits in ICP-OES spectrometry
  • Unique Sheath Gas Feature for unrivaled stability on samples with High Total Dissolved Solids Content, up to 30% dissolved solids
  • Continuous Wavelength Coverage from 120 to 800 nm with Far UV option for improved sensitivity for halogens analysis or alternative wavelengths
  • Unmatched Spectral Resolution minimizing interferences with <5 pm for wavelengths in the range 120-320 nm
  • Optional Dual Grating System, offering <6pm resolution up to 450 nm for line-rich matrices such as rare earth elements, geological or precious metals applications
  • Unique Hi Stab Device to achieve exceptional stability for demanding applications
  • Patented HDD® detection providing sub-ppb to percent level in a single analysis
  • Dynamic range of up to 10 orders of magnitude using Image
  • Optional 0.5m or 1m polychromator for simultaneous analysisImage Navigator
  • Full spectrum display with multiple spectra display capability
  • Visual comparison with overlaid spectra display capability
  • Automated qualitative and semi-quantitative analysisMASTER, find easily the right wavelengths
  • MASTER facilitates the method development by performing automatically selection of appropriate lines according to the concentration range of each element and the matrix.
  • MASTER is based on the proprietary S3-base developed with real ICP spectra acquisitions and containing more than 50,000 wavelengths identified with full spectroscopic data.
  • Automatic wavelength selection
  • Synthetic spectra display
  • Sensitivity, dynamic range and interference level criteria to adjust line selection S3-base viewer
  • S3-base viewer displays the entire S3-base database to help with identification of emission lines in unknown samples
  • Full S3-base database available
  • Display of analyte wavelength and its relative intensity and detection limit
  • Display of the list of potential emission lines, including plasma inherent lines, in the vicinity of a selected wavelength with their relative intensities and detection limits
  • Graphic display of analyte emission line and potential emission lines for facilitated identification 

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Glow Discharge Optical Emission Spectrometer GD Profiler 2
Pulsed RF GD-OES is the ideal analytical companion tool for coated material studies, process elaboration and control as it offers ultra fast elemental depth profile analysis of thin and thick layers, conductive or isolating, with high sensitivity to all elements.
  • RF-Only generator is Class E standard and optimized for stability and crater shape allowing for Real Surface Analysis.
  • Source can be pulsed with synchronized acquisition for optimum results on fragile samples. The use of an RF source allows analysis of conventional and non-conventional layers and materials.
  • Simultaneous optic provides Full Spectral Coverage from 110 to 800nm, including deep UV access to analyze H, O, C, N and Cl.
  • HORIBA Jobin Yvon original, ion-etched holographic gratings assure the highest light throughput for maximum light efficiency and sensitivity.
  • Patented HDD detection provides speed and sensitivity in detection without compromise.
  • Easily Accessible Sample Compartment allows plenty of room for sample loading.
  • Powerful QUANTUM™ software with Tabler Report writing tool.
  • Centerlite Laser Pointer (patent pending) for precise sample loading.
  • Monochromator Option Available only from HORIBA Jobin Yvon provides the perfect tool to increase instrument flexibility while adding “n+1″ capability.

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Glow Discharge Optical Emission Spectrometer GD Profiler
Pulsed RF GD-OES is the ideal analytical companion tool for coated material studies, process elaboration and control as it offers ultra fast elemental depth profile analysis of thin and thick layers, conductive or isolating, with high sensitivity to all elements. The GD-Profiler HR offers 1.0m focal length providing optical resolution of 14pm with the simultaneous analysis of up to 60 channels.
  • Pulsed RF Source and unique Double Differential Pumping for optimum crater shape and resolution.
  • High Resolution Simultaneous Optics (1m focal length) with full spectral coverage from 110 to 800nm, including VUV H, (D), O, C, N and Cl.
  • New generation of HORIBA Jobin Yvon original, ion-etched holographic gratings assure the highest light throughput for maximum sensitivity.
  • Patented HDD detection provides Speed and Sensitivity in detection without compromise.
  • Easily Accessible Sample Compartment allows plenty of room for sample loading.
  • Powerful QUANTUM™ software with Report generator.
  • Patented CentreLite for precise sample loading.
  • Monochromator Option (1m focal length) available only from HORIBA Jobin Yvon provides the perfect tool to increase instrument flexibility while adding “n+1″ capability.

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Laser Diffraction Particle Size Distribution Analyser
The LA-960 is the highest performance laser diffraction analyzer available. The ability to measure real world samples down to lowest particle size of 30 nm and up to 5,000 μm is unique and extremely valuable for labs looking for flexibility.
  • The LA-960 features a Wide Measurement range from 10nm -5000um (Up to 3000 micron in WET mode) to measure every application.
  • NIST-traceable size standards verify that the LA-960 accurately measures peaks as fine as 30 nanometers.
  • Guaranteed Accuracy of ± 0.6% and Precision of ± 0.1% for NIST Standards
  • Suitable for Suspensions, Emulsions, Powders, Pastes, Gels, and Creams
  • 60 – Second Measurement cycle, even in wet mode boost productivity
  • Long lifesolid state laser source better than Gas Filled He-Ne Laser
  • Fully compliant with ISO 13320 recommendations regarding the measurement of materials on D10, D50 and D90.
  • The LA-960 Method Expert Software makes it easy to create robust, powerful methods for research and development purposes and quality control.

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MIRA 3

MIRA 3

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MIRA3 is a high performance SEM system which features a high brightness Schottky emitter for achieving high resolution and low-noise imaging. MIRA3 offers all the advantages that come with the latest technologies and developments in SEM; delivering faster image acquisition, an ultra-fast scanning system, dynamic and static compensation and built-in scripting for user-defined applications.

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Plasma Profiling Time Of Flight Mass Spectrometer
PP-TOFMS couples a glow discharge plasma to an ultra-fast time of flight mass spectrometer and provides chemical analysis of solid materials as function of depth.
  • Fast and direct analysis
  • The High-Density Plasma results in high Sputtering Rate and allows for Measuring Thick Layers up to 100 μm.
  • Despite the mm size crater formed, layers as thin as 1 nm are measured.
  • The separation of sputtering and ionization processes in the discharge volume gives the capability of a Calibration Free Semi Quantitative Analysis.
  • The use of pulsed RF excitation permits the analysis of conductive and insulating, inorganics, organics, and hydrides materials or layers.
  • In contrast with sequential mass spectrometers, TOFMS offers full mass spectrum at any depth, offering elemental (from H to U) and molecular information, including isotopic monitoring.
  • The Temporal Ion response over the RF source period is capitalised for high sensivity and to avoid isobaric interferences.
  • Enhance Signal to Noise ratio
  • Multidimensional Software

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Dynamic Light Scattering Nanoparticle Analyzer
The SZ 100 nano Partica instrument, depending on the configuration and application the system can be used as a particle size analyzer, or also used to measure zeta potential, molecular weight, (MW) and second virial coefficient (A2). Typical applications for the SZ-100 include nanoparticles, colloids, emulsions, and submicron suspensions.
    • The SZ-100 Series measures Particle Size from 0.3nm to 8μm and particle distribution width by dynamic light scattering (DLS).
    • Zeta Potential Measurement –200 to +200 mV.

    Longer life zeta potential cells with carbon electrodes

    • Molecular weight 1X103 to 2X107 Da

    Absolute molecular weight (Mw) and the second virial coefficient

    (A2) are obtained by performing static light scattering measurement

    as a function of sample concentration and preparing Debye plots.

    • Dual PMT detector system for high concentration and low concentration samples. It has backscatter detector at 1730 for high concentration & 900 detector for low concentration samples
    • Low wavelength 532nm solid state laser for smaller particle size determination

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MAIA3 Model 2016

MAIA3 Model 2016

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The MAIA3 model 2016 is an ultra-high resolution SEM with excellent imaging capabilities in the whole range of beam en- ergies. A versatile detection system and high spatial resolution allows the observation of even the nest surface details. This is an essential feature for comprehensive characterisation of nanomaterials, for observation of beam-sensitive samples common in the semiconductor industry and for comfortable imaging of non-conductive samples including uncoated biological specimens.

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About Us

Advance Scientific Equipment Pvt. Ltd. - Distributor / Channel Partner of inductively coupled plasma atomic icp oes, glow discharge optical emission spectrometer gd profiler 2 & glow discharge optical emission spectrometer gd profiler in Nagpur, Maharashtra.

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Nature of Business

Distributor / Channel Partner

Legal Status of Firm

Private Limited Company

GST Number

27AABCA3867B1ZY
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