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Forevision Instruments India Private Limited - Wholesaler of tabletop microscope, transmission electron microscope since 1997 in Hyderabad, Telangana.
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Schottky Fesem

Schottky Fesem

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Research Afm

Research Afm

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Tabletop Microscope

The new TM3000 Tabletop Microscope from Hitachi High-Technologies is set to transform the field of basic microscopy.
The TM3000 utilizes scanning electron microscope (SEM) technology. It is easy to use while retaining powerful imaging capabilities. Surface morphology is shown in stereoscopic detail with images in contrast due to different average atomic number composition within the sample.
It provides a real alternative to optical microscopes, stereo microscopes and confocal laser scanning microscopes. It has applications for many sectors including life science, food, cosmetics, healthcare, pharmaceutical, textiles, materials science, semiconductor and education.

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Transmission Electron Microscope

The H-7650 is Hitachi's latest transmission electron microscope developed specifically for applications in research fields such as biology, medicine, polymers and other advanced materials. Allowing high contrast low dose image observation, the H-7650 is optimized to reduce specimen damage associated with typical electron microscopy observation.
A high sensitivity digital camera has been integrated with the microscope and images can be recorded, stored, filed or transferred to anyone in the world efficiently and effortlessly.

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Transmission Electron Microscope

The H-9500 300 kV transmission electron microscope is designed to support research on solid state materials and polymeric materials. The new H-9500 300 kV TEM utilizes modern computer control and digital cameras to enhance user-friendliness. The H-9500 is known for its ease of atomic resolution imaging, high sample throughput and a wide variety of analytical capabilities.

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Schottky Fesem

Schottky Fesem

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This newest scanning electron microscope (SEM) from Hitach High Technologies can perform ultra-high resolution imaging together with various analytical functions. This is to meet the demands of a new market trend which increasingly requires image observation at ultra-high resolution and a wide variety of analytical work together in one SEM.
The SU-70 is a new-concept SEM, incorporating Hitachi’s field-proven semi-in-lens technology and a new Schottky electron gun. It features not only ultra-high resolution (1.0 nm/15kV, 1.6nm*/l kV) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging (deceleration mode*) derived from Hitachi’s highly reputed Super ExB filter technology. Its new Schottky electron gun, which can produce probe currents in excess of 200 nA†, enables a wide variety of analytical capabilities at high throughput. The newly designed specimen chamber also allows simultaneous mounting of various detectors such as EDX, WDX, EBSP, STEM, BSE, CL. This versatile port design also provides the option for a cryogenic sample stage.

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Research Afm

Research Afm

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The XE-100 is our flagship AFM. It is a mid-priced system that provides the ultimate AFM/SPM solution for Non-Contact nanoscale metrology of small samples in data storage, semiconductors, nanoscience, materials science, polymers, and electrochemistry.

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Research Afm

Research Afm

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With the arrival of the XE-150, Park Systems's large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with the ultimate AFM resolution and reliability. The XY motorized sample stage is optimized for large sample (150 mm × 150 mm) placement and allows full travel over the entire sample.

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Research Afm

Research Afm

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The XE-200 is an AFM with increased capacity that supports 200 mm wafer investigation. In addition to the precise scan performance provided by True Non-Contact mode, the XE-200 offers users an encoded XY stage that travels over the entire 200 mm x 200 mm sample area, an enlarged XY scan range of 200 μm x 200 μm, and a Z scan range of 25 μm. Also, the industrial-grade automation features of the instrument greatly minimize the user‘s required participation during system operation.

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Research Afm Bio Afm

The XE-Bio is an innovative yet user-friendly Atomic Force Microscope designed specifically for biomedical and other advanced life science research. The modular design of the XE-Bio provides the user with a wide array of imaging modes including the revolutionary Scanning Ion Conductance Microscopy (SICM) module. The SICM module is specifically designed for non-contact in-liquid imaging, which makes XE-Bio ideal for imaging biological samples in dynamic conditions such as living cells. AFM, SICM, and optical microscopy can easily be adapted to a host of qualitative and quantitative imaging applications including, but not limited to, cell biology, diagnostic medical science, drug delivery testing and pathology. The user-friendly structure and design of XE-Bio empowers the researcher to easily build customized experimental set-up.

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Research Afm Nsom

The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. The XE-NSOM offers a complete AFM system setup with unprecedented adaptability for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology.

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Petite Glove Box / Compact Glove Box

The La Petite Glove Box is comprised of essentially only two components. The top and bottom are sealed using a revolutionary new gel used in the clean room industry. The unit is only two-thirds the size of our "Basic Glove Box", SPI # 18003-AB and 18005-AB. The La Petite Glove Box is designed to be ergonomically correct for the average person.

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Electronic Analytical Balances

After many years of searching, we at SPI Suppplies have finally found the perfect family of precision weighing instruments for laboratory, jewelery and other applications. The entire family of electronic balances (some would say "scales") feature an all digital design, and with digital readouts featuring the very latest in electronics and analytical balance technology. We deal directly with the top technical people at Scientech and quite frankly, what convinced us of the superiority of the Scientech engineering and design over competitive products was their "live demonstration" to show really how very robust and in a sense, non-destructible is this family of precision analytical balances.

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Vacuum Greases

Vacuum Greases

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The Braycote family of high performance vacuum greases has formulated for use in extreme temperatures and extremely aggressive chemical environments, while at the same time, maintaining outstanding vacuum characteristics.

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Brand Portable Fume Hoods

We feature the SPI Supplies Brand® Ductless Portable Fume Hoods so that laboratory personnel can work much more safely without exposure to dangerous and toxic fumes, and at the same time, without spending large amount of money to install vents through walls and building roofs, something in leased or rental facilities that might not even be permitted by the building owners. The SPI Supplies Brand Ductless Portable Fume Hoods exceed OSHA, ANSI and all other relevant international standards for worker safety. Nothing is sacrificed, and certainly not in terms of safety, when a ductless fume hood is used relative to a conventional (ducted) fume hood.

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Coated Microscope Slides

Take advantage of the new ITO-coated substrates now being produced by SPI Supplies. All you have to do is connect electrical leads (to put a voltage potential across the slide) and the slide will be uniformly heated, higher even than the boiling point of water (if desired). High transparency (from UV to NIR) ITO coatings have applications not only for microscopy but any time planar, electrically conductive surfaces are required that have the just indicated transparency. Our coatings are also used by researchers in the areas of liquid crystal display technology, polymer light emitting diode technology and related applications.

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Desiccator Cabinets

The new Secador desiccating cabinets form an entire family of desiccator products, known for their very high quality but with economical prices. They are intended for both long and short terms storage of critical laboratory samples that must be stored in a dry, dust-free environment. They feature a new contemporary design and would fit right into the environment of any modern laboratory anywhere. With the auto desiccating option, these cabinets never need to have desiccant changed, and thereby eliminating a particle contamination source prevalent in conventional desiccator chambers.

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Osmium Plasma Coater

For users of FESEM instruments in particular, this new model of this compact unit offers a coating that is amorphous and therefore one that exhibits no grain size. It also deposits a coating that is completely inert, won't change with time, and has a major advantage over chromium coating since chromium after a very short time has oxidized beyond the point where the sample would still be conductive for examination by SEM. Up to 4 individual samples can be coated at one time in this newest model of this exciting technology for metallizing SEM samples.

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Compact High Performance Vp Sem

The S-3400N is Hitachi’s newest addition to a world class Variable Pressure SEM line-up. Built on the success of the S-3000 series instruments, the S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. A new analytical chamber provides a total of ten ports with three high take off angle ports for EDS, Full Focusing WDS, PBS, EBSD, and XRF. A BSE detector allows TV rate scanning and high resolution imaging. Hitachi’s patented Quad variable gun bias and SE accelerator plate ensures high currents for low voltage applications now approaching Field Emission performance.

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Focused Ion Beam System

The FB-2100 Focused Ion Beam System offers significant benefits over conventional ion beam milling systems, including built-in imaging capabilities and sample handling compatibility with Hitachi's HF-3000 TEM, HF-2200 TEM, S-5500 SEM and the HD-2000.

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Corrected Stem

Corrected Stem

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Electron Source: Schottky emission or cold field emission
Resolution 0.144nm (dark field STEM)
Acceleration voltage 200KV
High Resolution Observation & High sensitive analysis are made
possible by correcting spherical observation(that limits the
performance of EM) in cooperation with CEDS, GmbH
Optional EDS, EELS, Live diffraction & micro pillar holder for 3D
analysis
HD-2700 is also available without Cs Corrected Lens

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Fe Sem

Fe Sem

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The Hitachi S-5500 In-lens FE-SEM is a dedicated ultra-high resolution FE-SEM for the advancement of leading edge research and development of nanotechnologies. Our patented in-lens technology provides the ultimate performance of imaging resolution and EDX analysis.

An astonishing resolution of 1.6nm at 1kV and 0.4nm at 30kV are guaranteed onsite. Building upon the mechanical stability of the S-5200, the S-5500 is equipped with a shielding system for reduced EMI and acoustic interferences. These improvements in conjunction with a completely dry vacuum system assure our high-resolution guarantee for the life of the instrument.

Extending the capabilities of the S-5500 is its EDS solid angle of 0.15 or greater and newly designed BF/DF Duo-STEM detector (patent pending). This innovative STEM system contains an adjustable dark field detector for tunable collection angles. Sometimes a single image can change the way we look at life. The new S-5500 with its advancements in information collection will lead you to those opportunities.

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Fe Sem

Fe Sem

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The S-4800 compliments the field proven performance and reliability of the S-4700 and S-5200 Field Emission SEMs. It employs a semi in-lens detector designed for large sample accomodation while achieving ultra-high resolution at low accelerating voltages. A new objective lens design with Hitachi's patented Super ExB filter technology collects and separates the various components of pure SE, compositional SE and BSE electron signals. The S-4800 can be fully integrated with many optional accessories including Energy Dispersive X-ray Spectrometer (EDX) and Electron Backscattered Diffraction Pattern (EBDP) systems. Ideal for ultra-high resolution appilcations such as semiconductor, materials studies and nanotechnology.

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Variable Pressure

SU6600 utilizes advanced Variable Pressure (VP) technology and allows accommodation of EDX, WDX and EBSP system for versatile material analyses in addition to high resolution imaging and materials characterization. The VP mode allows the operator to change vacuum conditions in the sample chamber from high vacuum to low vacuum.

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Research Afm

Research Afm

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An economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as all other systems in the XE product line.

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Industrial Afm Lcd

Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming a powerhouse in applications involving surface roughness, trench width, depth, sidewall slope, and line width characterization. The completely automated XE-LCD is designed for characterization of flat panel displays as either an in-line or off-line inspection tool.

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Industrial Afm Wafer

The XE-WAFER is a fully automated industrial AFM designed specifically to address surface roughness, trench width, depth and angle measurements on 200mm & 300mm wafers in a production environment. The system provides superior accuracy and precision nanometrology than any in the market today. Providing the highest resolution and the lowest gage sigma value imaginable for repeatability and reproducibility in the world, the XE-WAFER is the perfect solution for the semiconductor and hard disk drive industry which, until now, had very limited choice of industrial grade in-line inspection tools. We, Park Systems, take pride in providing you with the metrology solution you have been longing for.

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Silicon Membrane Window Grids

Silicon Membrane grids are available in both solid thin films and perforated amorphous films. The thin membrane films (under 20nm) are stable, enabling a wide range of applications and creating numerous opportunities in broad fields requiring size-based or charge-based separation of ions, molecules, or other nanoscale objects.

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Universal Ampoule Breaker

The SPI Supplies Universal ampoule breaker is the first of it kind to address both the issue of safe opening and safe disposal of glass ampoules of all available commercial sizers. Fits all size ampoules ideal for use with osmium tetroxide and/or gluteraldehyde.

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Park Systems High Resolution Afm

Supports all AFM / STM Modes Spectroscopy
Decoupled XY (50µm x 50µm) and Z scanners (12µm) – enables flat XY scan without bowing effect
True Non-Contact AFM minimizes Tip-Sample interaction, means prolonged usage of tips for more and more scans
Larger working range: 25mm x 25mm XY stage moment
Larger Z Scan range: 12um
Built-in on-axis CCD tip-sample Viewing system with 1um resolution

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Electron Microscope Film

What is a disaster for some could be great opportunities for others. With the rapid decline of the conventional photographic market, emulsion products of all types are being discontinued right and left. Not wanting to leave our customers out on a limb, and with the film supply some day abruptly ending, we have worked with MACO, a firm that specializes in "taking over" the production of discontinued emulsion products, to develop

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Micromachined Holey Carbon Grids

Quantifoil is a perforated support film with a precisely pre-defined hole size, shape, and arrangement. The use of these support foils as "support films" on TEM grids offers a number of advantages not only for conventional transmission electron microscopy (TEM), but also for low-energy point source (LEEPS) microscopy when compared with conventional holey carbon support films. Of course, if you don't need the ultimate holey carbon films

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VP Mode standard

  • 20% reduction in footprint compared to the current model
  • SE 3.0 nm resolution at 30 kV, BSE 4.0 nm (6 Pa) guaranteed
  • Acceleration Voltage : 0.3 -30 KV)
  • Magnification : x5 – x300,000
  • Saves floor space and electric power consumption due to TMP evacuation system
  • Specimen Stage: X=0-80mm, Y=0-40mm; Z=5-50mm; T=-20 – 90 degrees: R=360degrees
  • Max. Specimen Size : 152mm in diameter
  • Max. Observable Area : 126 in diameter ( XYR simultaneous use)
  • Max : Specimen Height : 60mm (WD = 15MM)

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The S-3700N features a newly developed ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received with high reputation from customers around the world. They feature low vacuum observation method (6 – 270 Pa) which enables observation of non-conductive samples like electronic components, and water containing samples such as cultured cells, without any sample preparation.

The 3700N's stage has a wide traverse range for observation of sample areas over 200mm in diameter and 110mm in height. Moreover, simultaneous attachments for EDX, WDX, and EBSP analyses are possible at optimized analitical geometry. Electron optics and operational functions follow the specification of the S-3400N, which has now sold over 300 units since its release in July, 2004.

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Forevision Instruments India Private Limited - Wholesaler of tabletop microscope, transmission electron microscope since 1997 in Hyderabad, Telangana.

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Nature of Business

Wholesaler

Total Number of Employees

26 to 50 People

Year of Establishment

1997

Legal Status of Firm

Private Limited Company

GST Number

36AAACF5025D2Z4
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