I R Technology Services Pvt. Ltd.

Model Name/Number	MiniFlex
Usage/Application	Laboratory
Brand	Rigaku
Configurations	External PC, MS Windows OS, SmartLab Studio II software
Detector	high speed 1D detector D / teX Ultra 2 or 2D detector HyPix-400 MF
Dimension	620 (W) x 722 (H) x 456 (D) mm (MiniFlex600 main unit, separate water supply device) 620 (W) x 722 (
Input Voltage	600 W X wire tube
Weight	80 kg (MiniFlex600 main unit, separate water supply device), 90 kg (MiniFlex600-C main unit

Desktop X-ray diffractometer

Compatible with Lab Solutions

Multipurpose powder X-ray diffraction analyzer with high resolution, high angle accuracy, and high PB ratio approaching high-end models
Short-time measurement is commonplace

Equipped as standard with a high-performance detector that achieves a detection efficiency of about 100 times that of conventional scintillation counters. High-speed / high-intensity measurement can be performed as standard.
The detector can be selected from the high-speed 1D detector D / teX Ultra 2 or the 2D detector HyPix-400 MF.

The influence of orientation and coarse grains is also obvious

By combining with the 2D detector HyPix-400 MF, the orientation of the sample and the influence of coarse particles can be seen at a glance. Even if the particles are coarse, it is possible to obtain a powder X-ray diffraction profile that is close to the intensity ratio of the database based on the 2D measurement data.

Easy installation, space saving

Can be installed with 100V power supply and space for one desk. It can be used with a power supply of 100V, 15A.
MiniFlex600-C Width 620mm, Height 722mm, Depth 526mm (Built-in water supply device)
MiniFlex600 Width 620mm, Height 722mm, Depth 456mm (By water supply device)

Safety design (no need to appoint an X-ray work chief (Japan))

Uses a completely sealed cabinet structure. Due to the interlock mechanism, the door of the sample chamber cannot be opened while irradiating with X-rays. There is no need to appoint an X-ray work chief (Japan), and safety management of the equipment is easy.

High resolution

It is also useful for profile analysis such as the Rietveld method and measurement of organic matter where complicated peaks are observed. Due to the high output of 600W, the measurement time for high resolution measurement can be significantly reduced. If you use the automatic sample exchange device, you can handle long-term unmanned operation.

High angle accuracy

High-precision mechanical link axes with evenly spaced control and real-time angle correction ensure the best angle accuracy at all times.

High PB ratio

The hybrid incident slit * and scattering protector (patent pending) enable high PB ratio and blind-free measurement from low to high angles.
* Hybrid incident slit: Continuously variable slit + fixed slit function

Abundant attachments

 8 automatic sample changer  Temperature variable attachment  Light receiving monochromator  Rotating sample stand  General-purpose atmosphere separator

Application example

 Quantitative analysis of asbestos and free silicic acid   Quality control of pharmaceuticals and industrial raw materials  Pattern measurement of crystalline, amorphous and polymorphic crystals  High school / technical college / university education, student experiments, etc.

Brand	Rigaku
Model	Ultima IV
Maximum Rated Output	3 kW
Rated Tube Voltage	20-60 kV
Rated Tube Current	2-60 mA
Target	Cu (others optional)
Focus Size	0.4 x 12 mm (others optional)
Goniometer radius	285 mm
Minimum Step Size	0.0001 Degree
Divergence Slit	Fixed or Automatic Variable
Scattering Slit	Fixed or Automatic Variable
Receiving Slit	Fixed or Automatic Variable
Optics Alignment	Automatic alignment of tube height, goniometer, optics and detector
Monochromator	Dual position graphite diffracted beam monochromator for Cu (others optional)
Detector	Scintillation counter (others optional)
H x W x D	1600 x 1100 x 800 mm
Sample Height	1050 mm

The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements fast.

 

Engineered for Performance
With a multipurpose diffractometer, performance is measured by not only how fast you perform an experiment but also how fast you can switch between different types of experiments. Individual experiments are optimized with accessories like the D/teX Ultra high-speed position sensitive detector system, but the speed between experiments is radically improved with the combination of the automated alignment and CBO.

Designed for Flexibility

The Ultima IV is the only XRD system on the market today that incorporates fully automatic alignment. When coupled with CBO and the in-plane arm, the automatic alignment capability makes the Ultima IV X-ray diffractometer the most flexible system available for multipurpose applications.

Functionality Redefined

In the Ultima IV XRD system, CBO technology eliminates time spent switching geometries, enables everyday users to run both sets of experiments without the need to reconfigure the system, and reduces wear and possible optic damage associated with the recurrent switching process. CBO and automatic alignment combine for the ultimate in functionality for micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering.

 

Features:

• Full automated alignment under computer control.
• Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
• Focusing and parallel beam geometries without reconfiguration.
• SAXS capabilities.
• Optional D/teX Ultra high-speed, position-sensitive detector system

Other details:

• Scanning mode: θs/θd coupled or θs, θd independent
• 2θ measuring range: -3 to 162° (maximum)

Brand	Rigaku
Model	SmartLab
X ray Generator	3 kW for sealed x-ray tube, 9 kW for PhotonMax rotating anode
Tube Voltage Variable Range	20-60 kV(3 kW for sealed x-ray tube), 20-45 kV(9 kW for PhotonMax rotating anode)
Tube Current Variable Range	2-50 mA(3 kW for sealed x-ray tube), 10-200 mA( 9 kW for PhotonMax rotating anode)
Enclosure Dimension	1300x1300x1880 mm, 51.2x51.2x74 inch(WxDxH)
Ground Resistance	Less than or equal to 100 ohm
Weight	~750 kg, 1653 lb(3 kW for sealed x-ray tube), ~850 kg, 1874 lb(9 kW for PhotonMax rotating anode)

Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

 

Engineered for Performance

This new X-ray diffraction system features the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D and 2D measure­ment modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of preparing and switching individual detectors for different applications. The HyPix-3000 detector can be used to obtain 2D powder diffraction patterns, which can be processed to deliver superior qualitative analysis by using all the 2D pattern information. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system’s new Cross-Beam-Optics (CBO) family feature fully automated switchable reflection and transmission optics (CBO-Auto).

 

Designed for Flexibility

Coupling a computer controlled alignment system with a fully automated optical system, and the User Guidance functionality within the SmartLab Studio II software, makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

 

Functionality Redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the XRD functionality to make the measurements you want to make when you want to make them. The equipment accepts powder, liquid, films, and even textile samples and allows mapping measurements within suitable samples. Operando (a.k.a., real time in-situ) measurements can be performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis. The system also features robust security and validation protocols to ensure that any technology component - software or hardware - fulfills its purpose within regulatory guidelines, including 21 CFR Part 11, establishing the US EDA regulations governing electronic records and electronic signatures (ER/ES).

 

Features:

• Available in-plane arm (5-axis goniometer)
• Highest flux X-ray source: PhotonMax
• HyPix-3000 high energy resolution 2D HPAD detector
• New CBO family, with fully automated beam switchable CBO-Auto and high-resolution micro area CBO-μ
• Operando measurements with SmartLab Studio II software
• Multi-year component warranty contributes to the low cost of ownership

Power Supply:

• Three phases AC200V, 50/60 Hz, 30 A or single phase AC200-230V, 50/60 Hz, 40A(3 kW for sealed x-ray tube)
• Three phases AC200V, 50/60 Hz, 60 A (9 kW for PhotoMax rotating anode)

Brand	Rigaku
Model	AutoMATE II
Maximum Power	3 kW (Tube voltage 20 - 50 kV, Tube current 2 - 50 mA)
Stability	+/-0.03 % (Power fluctuation within +/-10%)
Distance	X-ray source - sample 265 mm, Sample - detector 210 mm
X ray Shutter	Rotary Shutter
CCD Camera	(Magnification) x22 to x135 (Field of vision 6 mm to 1 mm), Focal distance(90 mm)
Dimension	One dimension (Semiconductor system)
Number of Channels	1024 channel
Maximum Counting Rate	1 x 106 cps/ch x 1024 ch (Total 1 Gcps/all)
Window Area	76.8 mm x 10 mm
Size	135 mm (W) x 95 mm (D) x 100 mm (H)
Weight	1.4 kg
Cooling System	Air-cooled water chiller
Cooling Capacity	2 kW
Cooling Temperature Range	15 Degree C to 25 Degree C
PC	Desktop Personal Computer
OS	Windows 7 Professional (32 bit)
Display	19" TFT
Printer	Ink jet color printer
Computer Rack	Vertical Type

Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation.

 

With the AutoMATE II, you now have the best of both worlds. Large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) can be measured with high accuracy. This is possible because the X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with an accuracy of 0.1 microns when using the automated XYZ stage.

 

The detector used in the AutoMATE II is the D/teX Ultra1000, an electronic Si strip detector that has high dynamic range, high sensitivity, and good energy resolution, as well as not requiring any consumable gas.

Other Details:

X-ray tube:

• Standard: Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type
• Option: Cu (2 kW), Co (1.8 kW), Fe (1.5 kW), V (0.3 kW)

 

2θ Scanning Range:

• 2θ = 98° to 168° (Central angle range of D/teX Ultra 1000 2θc = 108° to 158°)

 

ψ Angle Range: ψ = 0° to +60° (at maximum)

Oscillation Range: ψp = ±1° to ±10°

Incident Collimator: Standard: φ150 μm, φ1 mm, Option: φ30 μm, φ50 μm, φ100 μm, φ300 μm, φ500 μm, φ2 mm, φ4 mm

Standard: Manual Z stage:

• Lab. jack (Model LJA-16223)
• Maximum sample space: 720 mm (W) × 560 mm (D) × 540 mm (H)
• Stage dimensions: 160 mm × 220 mm
• Maximum load: 30 kg

 

Option: Auto XYZ stage:

• Maximum sample space: 720 mm (W) × 560 mm (D) × 335 mm (H)
• Stroke: X-Y axis = ±50 mm, Z axis = -5 mm to + 35 mm
• Stage dimensions: 150 mm × 150 mm
• Maximum load: 20 kg

Brand	Rigaku
Model	SmartSite RS
Dimensions	114(W) x 248(D) x 111(H) mm
Weight	3 kg
Bore Size	200 mm (Diameter)
Power Source	Integrated Battery or AC
Supply Voltage	100-240 V
Detector Type	High-Speed Two-Dimensional (2D) Semiconductor Detector

The SmartSite RS (Residual) is the world’s smallest portable stress analyzer that is especially designed for field analysis. It enables to characterize residual stress of metal parts ranging from large construction projects to individual products, e.g. bridges, maritime vessels, aircraft, aerospace equipment, pipelines, heavy machinery and automobiles.

 

Rapid & easy data acquisition

Residual stress is measured by 60 seconds or less in most of the cases. 1-click operation thanks to pre-define measurement and sample parameters.

 

Remote operation through a tablet PC and Wi-Fi

The instrument is remotely controlled by a table PC equipped with Wi-Fi communication. This design is especially useful if the measurement must be performed in a hazardous area or where access is limited.

 

No on-site utilities required

The integrated affords up to 100 measurements before recharging. It also doesn’t require any other utilities, like cooling water. Therefore, there is no need to prepare any special on-site utilities.

Features:

• The instrument is remotely controlled by a table PC equipped with Wi-Fi communication.
• Battery operated with an exchangeable battery. There is no need to prepare utilities on-site, e.g. cooling water and electricity.
• 1-click operation thanks to pre-define measurement and sample parameters.
• Easy setup using integrated three-dimensional (3D) sensors and indicators displayed on table PC.
• Easy positioning using the integrated CCD camera, LASER marker and white LED for illumination in low light environments.
• Calibration is easily done with the included calibration standards. The calibration history is recallable at any time to ensure measurement traceability.

Brand	Rigaku
Dimension	1270 (W) x 1880 (H) x 1220 (D) mm
Weight	Approximately 800 kg (main body)
Method	X-ray diffraction (XRD)
Use	Powder diffraction, thin film diffraction, SAXS, polar figure, residual stress and temperature /
Technology	Fully automatic multipurpose X-ray diffractometer with user guidance

Fully automatic multipurpose X-ray diffractometer

Compatible with Lab Solutions

Equipped with a "guidance" function that condenses Rigaku's analysis know-how, achieving ultimate automation.Various powder X-ray diffraction measurements can be performed without experience

X-ray analysis integrated software "SmartLab Studio II" with powerful user guidance function supports from measurement to analysis. Based on Rigaku's analysis know-how, the software proposes the optimum optical system, and automatically adjusts the optical system and sets the measurement conditions. A wide range of powder X-ray diffraction measurements such as powder profile measurement and micro part / in-situ measurement are possible.

Wide-angle powder X-ray diffraction profile measured in just minutes

The entry model equipped with the high-resolution, high-speed one-dimensional X-ray detector D / teX Ultra 250 supports high-speed centralized measurement. Measurement with suppressed background level is possible, and it is easy to detect trace components due to the strength integration effect.

The world expanded by 2D X-ray diffraction measurement

The high-end model equipped with the hybrid multidimensional pixel detector HyPix-400 supports microscopic and in-situ measurements. In addition, information on sample conditions such as particle size and orientation can be easily obtained. What we haven't noticed until now greatly expands the range of knowledge that can be obtained by powder X-ray diffraction measurement.

Compatible with all measurement scenes

The optical system selection unit (Cross Beam Optics) and the optical system / sample position automatic adjustment program realize easy and quick optical system switching. The optimum optical system / attachment can be selected according to the purpose of analysis and the shape j of the sample.

Realize various applications

We have prepared a variety of optical system arrangements to realize various applications such as measurement by reflection method / transmission method, minute area measurement using polycapillary, small angle X-ray scattering measurement, residual stress / polar figure measurement, etc. SmartLab SE also automatically adjusts those optical systems.

Achieve a smooth analysis environment with unified operability

With "Smart Lab Studio II", you can perform everything from device control such as optical system management and measurement required for analysis to data analysis on a single software. User usability has been greatly improved, such as optical system sensing, guidance functions, and flow bar navigation.

Abundant attachments and sample holders

We have 6 automatic sample exchangers, 10 automatic sample exchangers, capillary rotating sample table, αβ attachment, battery cell attachment, various temperature control attachments, general-purpose atmosphere separator, non-reflective sample holder, sample holder for transmission method, etc.

Model Name/Number	XtaLAB Synergy-ED
Usage/Application	Laboratory
Brand	Rigaku
Detector	High-speed, high-sensitivity electron direct counting detector HyPix-ED
The biggest feature	Dedicated device for electron diffraction. HPC detector, sample axis for high precision and high til
Analytical method	Single crystal electron diffraction method
Electron radiation source	Maximum acceleration voltage 200 kV

Electron diffraction integrated platformAn integrated platform for structural analysis by electron diffraction that is ready for chemists and crystallographers.Features

• An electron diffraction integrated platform that provides a seamless workflow from data measurement to crystal structure determination.
• Taking advantage of the advantage of electron diffraction that can measure nano-sized crystals, it is possible to determine the structure of microcrystals of several hundred nanometers or less.
• Since it is an electron diffraction dedicated device, it is efficient without interference with electron microscope researchers. This will eliminate the wasted time required to switch between the settings for high-resolution transmission electron microscopes and the settings for electron diffraction.
• Researchers who have used single crystal X-ray structure analysis can start using it immediately. No proficiency in electron microscopy is required.

Model Name/Number	XtaLAB Synergy-i
Usage/Application	Laboratory
Brand	Rigaku
Configurations	External PC, MS Windows OS, CrysAlis Pro Software
Detector	HPC detector, HyPix-Bantam
Dimension	1300 (W) x 1875 (H) x 850 (D) (mm)
Weight	550 kg (main body)
option	Oxford Cryostream, Cobra, XtalCheck-S, Intelligent goniometer head, ELementA Nalyzer
Technology	K goniometer

Single crystal X-ray structure analyzer with HPC detectorUpgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples.

• Up to 50W Micro Focus X-ray Tube with Multilayer Mirror
• High precision κ goniometer
• HPC detector, HyPix-Bantam
• New cabinet with cabinet lighting
• The system complies with the strictest X-ray safety guidelines
• CrysAlis Pro  is a powerful, user-friendly software that comes standard with AutoChem, a fully automated structuring solution.
• Upgrade from single source to dual source is also possible

Model Name/Number	XtaLAB Synergy-S
Usage/Application	Laboratory
Brand	Rigaku
Detector	HyPix-6000HE or optionally the large theta coverage HyPix-Arc 150 Degree
Dimension	1300 (W) x 1875 (H) x 850 (D) mm
Weight	550 kg (core unit)
Core attributes	Single or dual microfocus sealed tube X-ray source diffractometer with hybrid pixel array detector
Goniometer	Fast kappa geometry goniometer that allows data collection scan speeds of up to 10 Degree/sec.
Accessories	Oxford Cryostream 800, Oxford Cobra, XtalCheck-S, High Pressure Kit, and Element Analyzer.

1 Single crystal X-ray structure analyzer equipped with photon detection type hybrid pixel detectorHigh-speed single crystal X-ray diffractometer for small molecule / biopolymer structure analysis.XtaLAB Synergy-S is a completely new single crystal X-ray structure analyzer developed with the highest priority on achieving the purpose of the user, regardless of whether it is a small molecule or a biopolymer.
It is designed for maximum performance by taking advantage of the features of state-of-the-art hardware and user-friendly software.
By utilizing XtaLAB Synergy-S, X-ray diffraction intensity data can be collected more accurately, quickly and intelligently.


Features:

• Very high performance with high brightness light source, noise-free X-ray detector and high speed goniometer
• Separation of reflections from large unit grids by using the variable slit option
• Significantly reduce running costs by extending the life of X-ray tubes
• Compact design that fits in the laboratory

Model Name/Number	XtaLAB Synergy Custom
Usage/Application	Laboratory
Brand	Rigaku
Configurations	External PC, MS Windows OS
Detector	HyPix HPC (Hybrid Photon Counting) detector
Key components	X-ray diffractometer with rotating anti-cathode X-ray generator and HPC detector
Technology	Customizable single crystal X-ray diffractometer
Use	Crystal structure analysis

Ultra-high-speed, ultra-high-precision single crystal X-ray structure analyzerSingle crystal X-ray structure analyzer developed with the highest priority on achieving the purpose.XtaLAB SynergyCustom is a single crystal X-ray structure analysis device developed with the idea of  using it regardless of whether it is a small molecule or a biopolymer.
The X-ray generator and optical system can be selected according to the application.
It is also designed for cutting-edge performance by updating your current X-ray generator.
By utilizing XtaLAB SynergyCustom, X-ray diffraction intensity data can be collected more accurately, quickly and intelligently.
This device is a single crystal X-ray structure analysis device equipped with an ultra-high-speed, ultra-high-precision κ goniometer and the HyPix HPC (Hybrid Photon Counting) detector, which is considered to be the most ideal of the existing detectors. The X-ray generator can be combined with RA-Micro7 HFM, FR-X, or your X-ray generator.
It is compatible with left and right port installation, and it is possible to build a system in combination with a single crystal structure analyzer, powder structure analyzer, small angle scattering device for biopolymers, BioSAXS-2000 nano , etc.
In addition, it can be further customized by installing an automatic crystal screening system ACTOR, combining it with attachments such as the electric sample centering system intelligent Goniometer Head, crystallization plate in situ, and X-ray irradiation attachment XtalCheck-S.

Model Name/Number	NANOPIX
Brand	Rigaku
Configurations	External PC, MS Windows OS, NANOPIX Guidance, 2DP, SAXS 1D
Detector	OptiSAXS optics and multidimensional pixel detector
Technology	Small angle resolution (Qmin: ~ 0.02nm -1 )
Use	Nanoscale (0.1nm-100nm) structural evaluation
Key component	Powerful X-ray source with OptiSAXS optics and multidimensional pixel detector
Method	Small-angle and wide-angle X-ray scattering (SAXS / WAXS)
option	GI SAXS, DSC, temperature and humidity control

Nanoscale X-ray structure evaluation deviceSmall-angle X-ray scattering measuring device with the highest level of small-angle resolution (Qmin to 0.02nm-1).as a laboratory device. It is ideal for nanoscale (0.1nm to 100nm) structural evaluation, and can analyze regular and irregular structures of solids, liquids, liquid crystals, gels, etc. It is useful for measuring the particle size distribution of nanoparticles, analyzing the three-dimensional structure of protein molecules, evaluating separation and dispersion, and researching advanced materials with highly controlled nanoscale microstructures such as carbon fiber reinforced resin (CFRP).

Model Name/Number	NANOPIX mini
Usage/Application	Industrial
Brand	Rigaku
Configurations	Bonse-Hart configuration, line focus optics, 600 W X-ray generator
Dimension	580 (W) x 730 (H) x 500 (D) (mm)
Weight	90 kg (core unit)
Use	Analysis from average particle size and particle size distribution measurement
Technology	Small Angle X-ray Scattering Instrument (SAXS)

NANOPIX mini is a desktop measurement system that specializes in particle measurement and pursues ease of use. It has high small-angle resolution and can obtain structural information of several hundred nm that appears at extremely low angles. From measurement to analysis of average particle size and particle size distribution, it can be done in a few minutes to several tens of minutes.

Model Name/Number	XtaLAB mini II
Usage/Application	Laboratory
Brand	Rigaku
Configurations	External PC, MS Windows OS, CrysAlis pro software
Detector	hybrid photon counting detector
Dimension	560 (W) x 674 (H) x 395 (D) (mm)
Input Voltage	600 W X-ray tube
Weight	100kg (main body)
technology	Desktop (desktop) X-ray diffractometer equipped with the latest detector

Desktop single crystal X-ray structure analyzerDesktop single crystal X-ray structure analyzer equipped with 1 photon detection type hybrid pixel detector.The XtaLAB mini II is the world's smallest desktop single crystal X-ray structure analyzer equipped with a 1-photon detection hybrid pixel detector. This product can be easily used by those who have thought that X-ray crystal structure analysis is difficult.

Equipped with a state-of-the-art 2D semiconductor detector

Equipped with a 1-photon detection type hybrid pixel detector, it enables faster and more accurate measurement than before. In addition to achieving true shutterless measurement, there is no overload measurement, so measurement can be performed in a short time.

The world's smallest tabletop device

The world's smallest size with a width of 560 x depth of 395 x height of 674 mm. Only AC100-240V outlet is required, so no special work is required.

No need to appoint an X-ray work chief (Japan)

By adopting an interlock mechanism, it is not necessary to appoint an X-ray work chief.

Equipped with automatic measurement / analysis mode

CrysAlis Pro is adopted as the software, and in collaboration with the automatic structural analysis plug-in AutoChem, it automatically executes from measurement to structural analysis. There is a structural analysis viewer on CrysAlis Pro , and you can check the structure in the shortest time.

High quality data

You can acquire high-quality X-ray diffraction data that meets the criteria for submission to specialized magazines.

Simple design reduces maintenance costs

Maintenance costs can be reduced by limiting the moving parts to only three locations, the shutter and goniometer φ-axis and ω-axis.

Sample mounting with one touch

A magnet pin is used, and the sample can be attached with one touch.

Low temperature measurement is possible

Low temperature measurement is possible by installing a spray low temperature device.