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XRF Analyser

Our product range includes a wide range of Rigaku Supermini200 XRF Analyser, Rigaku ZSX Primus XRF Analyser, Rigaku ZSX Primus II XRF Analyser, Rigaku Micro-Z ULS XRF Analyser, Rigaku Mini-Z series XRF Analyser and Rigaku AZX 400 XRF Analyser.

Rigaku Supermini200 XRF Analyser
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BrandRigaku
ModelSupermini200
X ray GeneratorMax. 50 kV, 4 mA
X ray TubePd target, 200 W air-cooled
Crystal Changer3 Crystal Changer
Analyzing CrystalsStandard LiF 200 (for Ti-U) and PET (for Al-Ti), option RX25 (for F-Mg) or Ge (for P-Ca)
DetectorsLight elements F-PC (gas flow proportional counter), heavy elements SC (scintillation counter)
Sample Changer12-position sample turret
Sample SizeMaximum sample size 44 mm diameter, 33 mm height
Sample Spinning30 rpm
Spectrometer Chamber AtmosphereVacuum, vacuum/helium (option)
Vacuum PumpRotary Pump
Operating SystemWindows 7
Power Requirements100 - 120V (50/60 Hz) 15A or 200 - 240V (50/60 Hz) 10A
Installation EnvironmentTemperature 15-28 Degree C, relative humidity less than 75%

The new Supermini200 has improved software capabilities as well as a better footprint. As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD).


Low cost of ownership

Not only is the Rigaku Supermini200 an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. The Supermini200 does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.


Superior light element performance

Analyzing complex matrix materials with a wide range of light and heavy elements, from trace to high concentration levels, is the instrument's core competency. Rigaku Supermini200 delivers high sensitivity for light elements with superior spectral resolution for resolving line overlaps in complex matrices without the need for deconvolution. Analyzing low concentration levels of light elements (F, Na, Mg, Ca, Si, Al, and P) is easy.


High power X-ray tube

Supermini is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.


Primary beam filter
  • Automatic in and out; select one from Zr filter for Cd analysis (standard) and Al filter for trace K analysis

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Rigaku ZSX Primus XRF Analyser
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BrandRigaku
ModelZSX Primus
Beam Collimators6 autoselectable diameter35, 30, 20, 10, 1 and 0.5 mm 27 mm can be select instead of 30 mm for SSLS
Sample Changer48 positions standard, 104 SSLS optional
Angular ReproducibilityUltra-high precision
Primary X ray FiltersAl25, Al125, Ni40, Ni400 and Be (optional, for window protection)
Maximum Sample Size51 mm (diameter) by 30 mm (high)
Sample Rotation Speed30 rpm
Angular RangeSC 5-118 Degree, F-PC 13-148 Degree
Receiving SlitFor SC and for F-PC detectors
X ray TubeEnd window, Rh-anode, 3kW or 4 kW, 60kV
Continuous Scan0.1 - 240 Degree/min
Crystal Changer10 crystals, automatic mechanism
Vacuum System2 pump high-speed system w/ (optional) powder trap
Divergence Slit3 auto-selectable standard, high, and coarse (optional) resolutions

Rigaku ZSX Primus delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

 

Powerful, flexible and reliable elemental analysis

The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of delivering accurate results in a timely and seamless manner, with unsurpassed reliability, flexibility, and ease of use to meet any challenges in today's laboratory.

 

Low-Z performance with mapping and multi-spot analysis

Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus features a 30-micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. The available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

 

SQX fundamental parameters with EZ-scan software

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities, and different sample sizes. Increased accuracy is achieved using the matching library and perfect scan analysis programs.

General Specifications:

  • Elemental coverage: ¿¿¿Be through ¿¿¿¿¿¿U
  • Optics: Wavelength dispersive, sequential, tube below
  • Goniometer: θ – 2θ independent drive mechanism
  • HV power supply: High frequency inverter, ultra-high stability
  • Cooling: Internal water-to-water heat exchanger
  • Sample inlet: Air lock system

 

Detector Systems

  • Heavy element detector: Scintillation counter (SC)
  • Light element detector: Flow proportional counter (F-PC)
  • Attenuator: In-out automatic exchanger (1/10)

 

Features:

  • Small footprint uses less valuable lab space
  • Micro analysis to analyze samples as small as 500 μm
  • Tube-below design is optimized for liquids and loose powders
  • 30μ tube delivers superior light element performance
  • Mapping feature for elemental topography/distribution
  • Helium seal means the optics are always under vacuum

 

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    Rigaku ZSX Primus II XRF Analyser
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    BrandRigaku
    ModelZSX Primus II
    Beam Collimators6 auto-selectable diameters 35, 30, 20, 10, 1 and 0.5 mm
    Sample Changer48 positions standard, 96 optional
    X ray TubeEnd window, Rh-anode, 3kW or 4 kW, 60kV
    Sample Rotation Speed30 rpm
    Maximum Sample Size51 mm (diameter) by 30 mm (high)
    Angular RangeSC 5-118 Degree, F-PC 13-148 Degree
    Primary X ray FiltersAl25, Al125, Ni40 and Ni400
    Receiving SlitFor SC and for F-PC detectors
    Continuous Scan0.1 - 240 Degree/min
    Crystal Changer10 Crystals, Automatic Mechanism
    Divergence Slit3 auto-selectable standard, high, and coarse (optional) resolutions
    Vacuum System2 pump high-speed system w/ (optional) powder trap

    Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

     

    Tube above optics for superior reliability

    ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.

     

    Low-Z performance with mapping and multi-spot analysis

    Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

     

    SQX fundamental parameters with EZ-scan software

    EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

    General Specifications:

    • Elemental coverage: ¿¿¿Be through ¿¿¿¿¿¿U
    • Optics: Wavelength dispersive, sequential, tube below
    • Goniometer: θ – 2θ independent drive mechanism
    • He Flush System: Optional, with partition
    • Angular Reproducible: Ultra-high precision
    • HV Power Supply: High frequency inverter, ultra-high stability
    • Cooling: Internal water-to-water heat exchanger
    • Sample Inlet: APC automatic pressure controller

     

    Detector Systems

    • Heavy element detector: Scintillation counter (SC)
    • Light element detector: Flow proportional counter (F-PC)
    • Attenuator: In-out automatic exchanger (1/10)

     

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    Rigaku Micro-Z ULS XRF Analyser
    • Rigaku Micro-Z ULS XRF Analyser
    • Rigaku Micro-Z ULS XRF Analyser
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    Rigaku Micro-Z ULS XRF Analyser

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    BrandRigaku
    ModelMicro-Z ULS
    Ambient Temperature15 - 28 Degree C
    Pump Weight10 kg
    Power100-120 VAC, 15 A or 200-240 VAC, 10 A
    Pump Dimension323 x 142 x 189 mm
    Analyzer Weight36 kg
    Relative HumidityLess than 75% non condensing
    Analyzer Dimension450 x 410 x 440 mm
    Max Power40 W

    Designed for ultra-low level sulfur analysis of diesel, petrol (gasoline) and other fuels, the Rigaku Micro-Z ULS wavelength dispersive X-ray fluorescence (WDXRF) instrument features a novel design that measures both the sulfur peak and the back-ground intensity. The ability to measure and correct for changes in background intensity delivers a better net peak intensity measurement, resulting in superior calibrations and enhanced real world precision. Rigaku Micro-Z ULS complies with ASTM 2622-10, ISO 20884 and JIS K2541-7 methods.

     

    Superior optics for reliable sulfur analyses

    The Rigaku Micro-Z ULS is the ideal solution for sulfur analysis of petroleum based fuels, with a lower limit of detection (LLD) of 0.3 ppm sulfur. Employing robust fixed optics in a vacuum environment, and featuring a specially designed doubly curved RX-9 analyzing crystal, the Micro Z ULS delivers consistent high sensitivity measurements.

     

    ASTM D2622 performance for non-technical users

    Specifically designed for non-technical users, all operations – from calibration through routine analysis – can be performed via the easy-to-use interface. And the analyzer can be powered by any standard “wall” AC outlet.

    Instrument

    • Wavelength dispersive X-ray fluorescence analyzer-Includes vacuum pump
    • Elemental range: sulfur (S), LLD = 0.3 ppm
    • Application: analysis of fuels for sulfur content
    • Single measurement position (std. 35 mm cup)

     

    Supported methods

    • ASTM D2622-10
    • ISO 20884 and JIS K2541-7

     

    Excitation

    • 40 kV Cr-anode X-ray tube

     

    Detection

    • Doubly curved RX-9 analyzing crystal
    • Sealed proportional counter
    • Fixed optics with switchable receiving slit - To select peak or background
    • Pulse height analyzer (PHA)

     

    Atmosphere

    • Sample analysis in air
    • Optics are under vacuum

     

    Environmental conditions

    • Vibration undetectable by human
    • Free from corrosive gas, dust, and particles

     

    Computer

    • Embedded dedicated processor
    • Proprietary operating system

     

    Software

    • Up to 10 calibrations
    • Up to 30 standards per calibration
    • Selectable analysis time (up to 900 s)
    • Drift correction
    • Pulse height analyzer (PHA) adjustment

     

    User interface

    • LCD display
    • Embedded computer
    • Membrane keypad and navigation

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    Rigaku Mini-Z series XRF Analyser
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    BrandRigaku
    ModelMini-Z series
    X ray TubeCompact air-cooled Pd target X-ray tube
    Analyzing CrystalRX4, RX9(Zr analyzer), LIF(200)(Ni analyzer)
    DetectorS-PC
    Analysis Area30 mm Diameter
    Sample Chamber6-sample turret, special(Zr analyzer, Ni analyzer)
    Ground Resistance30 ohm or less
    Ambient ConditionRoom Temperature 15-28 Degree C (Daily Variation less than 2 Degree C), Humidity less than 75% RH
    GasHe (flow rate 100 mL/min), Dry air (flow rate 50 mL/min) for Zr analyzer, Ni analyzer

    A series of compact benchtop wavelength dispersive XRF analyzers, the Mini-Z series of analyzers are designed for analyzing specific single elements. Since the optics are optimally configured to a particular element, this series allows for high precision and low detection limits.

     

    High precision single element analysis

    Mini-Z can be configured as a Si analyzer (e.g., for coated Si on paper or plastic), an Al analyzer (e.g., for coated Al on paper or plastic), a Ni analyzer, (e.g., for Ni coating or plating), a Cl analyzer, a P analyzer (e.g., biofuels) or a Zr analyzer (e.g., for Zr coating).

     

    Self contained elemental analyzer

    The Rigaku Mini-Z series benchtop WDXRF spectrometers are completely contained X-ray generating systems. Interlocks and safety "X-RAY ON" indicators are present to protect operators from exposure to X-rays being produced. The spectrometers meet all North American safety codes and are CE marked.

    Features:
    • Excellent LLD
    • Peak and background measurements
    • Easy-to-operate software
    • No cooling water, plug-n-play
    • Light weight and compact body
    • Exceptional repeatability
    • Wide analysis range
    • High-resolution, wavelength dispersive optics
    • No complex sample preparation required (reagent treatment, etc.)

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    Rigaku AZX 400 XRF Analyser
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    BrandRigaku
    ModelAZX 400
    Primary Beam FilterAutomatic exchanger (6 filters max.), includes Al, Ti, Cu, Zr
    DiaphragmAutomatic exchanger, 30 mm, 20 mm, 10 mm, 1 mm, 0.5 mm diameter
    Sample SizeDiameter 400 mm max
    DetectorHeavy element = SC, Light element = F-PC
    High Voltage GeneratorHigh frequency inverter type, Max. rating 4 kW, 60 kV - 150 mA
    Crystal ExchangerMaximum 10 Crystals
    Thickness50 mm max
    Mass30 kg max
    Elements Applicable4Be ~ 92U
    X ray TubeEnd window type Rh target 4 kW
    OpticsWavelength-dispersive
    Measurement Spot Diameter30 mm to 0.5 mm

    Rigaku's unique AZX400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. This system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.

     

    Customized sample adapter system

    Having the versatility to adapt to your specific sample types and analysis needs, the AZX400 is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes.

     

    Sample view camera with special lighting

    Optional real-time camera allows the analysis point to be viewed on screen. The operator has complete certainty as to what is being measured.

     

    Traditional WDXRF analytical capabilities

    All analytical capabilities of a traditional instrument are retained in this "large sample" variant. Analyze beryllium (Be) through uranium (U) with high-resolution, high-precision WDXRF spectroscopy, from solids to liquids and powders to thin films. Analyze wide composition ranges (ppm to tens of percent) and thicknesses (sub Å to mm). Optionally available is diffraction peak interference rejection, for optimal results for single-crystal substrates. The Rigaku AZX400 complies with industry standards SEMI and CE.

    Features:

    • Flexible sample adapter system with inserts (made to order)
    • Mapping capability allows uniformity to be checked
    • General purpose: able to analyze Be to U by high-resolution, high-accuracy WDXRF
    • Software guides the user through measurement and analysis setup
    • Available SEMI S2 and S8 compliance and CE marking
    • Small footprint: 50% footprint of the previous model

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    Rigaku ZSX Primus III XRF Analyser
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    ModelZSX Primus III+
    BrandRigaku
    X ray TubeEnd window,Rh-anode,3kW,60kV
    HV Power SupplyHigh frequency inverter,ultra-high stability
    CoolingInternal water-to-water heat exchanger
    Sample Changer48 positions standard
    Maximum Sample Size51 mm (diameter) by 30 mm (high)
    Sample Rotation Speed30 rpm
    Primary X ray FiltersAl25,Al125,Ni40 and Ni400
    Beam Collimators4 auto-selectable diameters 35,30,20 and 10 mm
    Divergence Slit3 auto-selectable standard,high,and coarse (optional) resolutions
    Receiving SlitFor SC and for F-PC detectors
    Angular RangeSC 5-118 Degree,F-PC 13-148 Degree
    Angular ReproducibleUltra-high precision
    Continuous Scan0.1 - 240 Degree/min
    Crystal Changer10 crystals,automatic mechanism
    Vacuum SystemHigh-speed system

    Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal standards.


    Tube above optics for superior reliability

    ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or downtime due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.


    High precision sample positioning

    The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. This is important for applications that require high precision, such as the analysis of alloys. ZSX Primus III+ performs high-precision analysis using a unique optical configuration designed to minimize errors caused by non-flat surfaces in samples such as fused beads and pressed pellets.


    SQX fundamental parameters with EZ-scan software

    EZ-scan allows users to analyze unknown samples without any prior setup. This time-saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities, and different sample sizes. Increased accuracy is achieved using the matching library and perfect scan analysis programs.

    Features:

    • Analysis of elements from O to U
    • Tube above optics minimizes contamination issues
    • Small footprint uses less valuable lab space
    • High precision sample positioning
    • Special optics reduce errors caused by curved sample surfaces
    • Software tools for statistical process control (SPC)
    • Evacuation and vacuum leak rates can be optimized for throughput

    General
    • Elemental coverage: ???O through ??????U
    • Optics: Wavelength dispersive, sequential, tube above
    • Goniometer: θ – 2θ independent drive mechanism

    Detector systems
    • Heavy element detector: Scintillation counter (SC)
    • Light element detector: Flow proportional counter (F-PC)
    • Attenuator: In-out automatic exchanger (1/10)

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