The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 x 200 x 20 mm are profiled by the NP-AFM system, and several stage options areavailable for many types of samples

This compact, tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-AFM includes everything you need for AFM scanning: a stage, control electronics, probes, manuals, and a video microscope.

Use the SA-AFM for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research. The SA-AFM is a complete system and includes everything required for scanning all sizes and shapes of samples. It is easily integrated with all manufacturer’s inverted microscopes.

Nanoprofiler AFM for technical samples, wafers and discs

    Three sample stage options to accommodate substrates up to 200 x 200 x 20 mm

    Integrated high resolution video microscope

    Linearized XY piezoelectric scanner

    Accommodates standard-sized AFM probes

    Includes vibrating and non-vibrating topography modes, plus lateral force and phase mode imaging

    Utilizes a direct drive motorized probe approach

    Captures images with intuitive LabVIEW™-based software

By providing your researchers and students access to world class metrology tools.