3D Profilometers
This is the perfect system for precisely measuring and controlling surface quality in a production environment. The compact instrument is flexible and can be integrated into the production line in many ways. By using preset specifications for flatness and topography, measurements can be made quickly and at high product through put. The measurement itself is very fast and can be completely automated. The vertical resolution is a few nanometers and, depending on the task, different fields-of-view are available from 4.2 mm x 5.5 mm up to 19 mm in diameter. The large stand-off distance enables several unique measurement options, such as measuring topography through windows or in inaccessible places with the aid of a deflecting mirror.
Features:
- Non-contact topography measuring interferometer
- Designed for production environments
* Vertical dynamic range of up to 500 μm
* Fast measurement over large field-of-view (up to 19 mm in diameter)
Vibrotech Instruments Private Limited
Product Details
Company Details
Product Description
This is the perfect system for precisely measuring and controlling surface quality in a production environment. The compact instrument is flexible and can be integrated into the production line in many ways. By using preset specifications for flatness and topography, measurements can be made quickly and at high product through put. The measurement itself is very fast and can be completely automated. The vertical resolution is a few nanometers and, depending on the task, different fields-of-view are available from 4.2 mm x 5.5 mm up to 19 mm in diameter. The large stand-off distance enables several unique measurement options, such as measuring topography through windows or in inaccessible places with the aid of a deflecting mirror.
Features:
- Non-contact topography measuring interferometer
- Designed for production environments
- Vertical dynamic range of up to 500 μm
- Fast measurement over large field-of-view (up to 19 mm in diameter)
- High-precision vertical resolution <10 nm
- Accurate inspection of high-aspect-ratio surface topography (e.g. laser-drilled holes)
Additional Information
Item Code | TMS-300 |
About the Company
Seller Contact Details
Apt. A3, No. 4/7, Sivasailam Street, T Nagar Chennai - 600017, Tamil Nadu, India
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